This function is used to detect the surface defects of the deformed blank. The objective is to simulate the Stone Test in the shop. The function will calculate the magnitude of the lows on the part surface relative to the stone. The control window of this function is shown in Figure 8.15.1.

Figure 8.15.1  Defect Detection

DEFECT A, B, C, and D are the criteria for the surface defect. STONE LENGTH is the length of stone used for testing. SCAN INCREMENT is used to control the moving step of stone. STONE ORIENTATION defines the orientation of stone. The stone movement is normal to the stone orientation on the part surface. Click the pull-down menu on the right side of Stone Orientation to select option X (default), Y and XY (detect the orientations of X and Y simultaneously).

1.       The user should click SELECT ELEMENTS to select elements on the part for processing. The processing time increases exponentially as the number of selected elements increases. It is recommended to use the Face Reflection function to identify the possible detect areas before using this function.

2.       The Select Elements window is shown in Figure 8.15.2.

Figure 8.15.2  Select Elements Option

3.       After the desired elements are selected, click Exit to exit the function.

4.       LIST VALUE and FRAMES selection will be activated, as shown in Figure 8.15.3.

 

Figure 8.15.3  Defect Detection

l  Click any single frame to display defect contour, as shown in Figure 8.15.4. The contour color is in accordance with the detected defect depth. The red color shows the area on the mesh with the highest defect level. The user can define different defect levels for estimation. Element Result will perform calculation according to the element result or node result.

l  Compensate Initial Def.

This option is used to compensate the initial defects from the initial part shape. If this option is selected, the initial defect will be subtracted from the displayed defect result. Otherwise, the current defect will be used for calculation.

Figure 8.15.4  An Example for Defect Detection